DocumentCode
2926308
Title
Finite-difference analysis of open and short circuits in coplanar MMICs including finite metallization thickness and mode conversion
Author
Beilenhoff, K. ; Heinrich, W. ; Hartnagel, H.L.
Author_Institution
Inst. fuer Hochfrequenztech. Tech. Hochschule Darmstadt, Germany
fYear
1992
fDate
1-5 June 1992
Firstpage
103
Abstract
Open and short circuits as used in MMICs (monolithic microwave integrated circuits) are investigated by means of a finite difference method in the frequency domain. Both mode conversion and finite metallization thickness are accounted for. For the open stub, noticeable mode conversion is observed, whereas the short circuit behavior shows a significant dependence on metallization thickness.<>
Keywords
MMIC; electrical faults; finite difference methods; frequency-domain analysis; metallisation; coplanar MMIC; finite difference method; finite metallization thickness; mode conversion; monolithic microwave integrated circuits; open stub; short circuits; Capacitance; Circuits; Coplanar waveguides; Finite difference methods; Frequency domain analysis; Inductance; MMICs; Metallization; Scattering; Transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location
Albuquerque, NM, USA
ISSN
0149-645X
Print_ISBN
0-7803-0611-2
Type
conf
DOI
10.1109/MWSYM.1992.187918
Filename
187918
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