DocumentCode :
2926383
Title :
P2-28: Modeling of beam generation in IOT electron guns
Author :
Jackson, Robert H. ; Bui, Thuc ; Read, Michael ; Ives, Lawrence
Author_Institution :
Calabazas Creek Res., Inc., San Mateo, CA, USA
fYear :
2010
fDate :
18-20 May 2010
Firstpage :
277
Lastpage :
278
Abstract :
The computational capabilities needed for practical IOT/MBIOT design will be discussed. These were evaluated using a combination of analysis and test simulations employing static and fully electromagnetic codes. The presentation will focus on the most difficult aspect: simulation of beam formation in the cathode-grid region. It will be shown that electron transit delay in the cathode-grid gap causes inherent asymmetries in beam properties: pulse shape, secondary emission, etc. Acceleration across the anode - cathode gap exacerbates these differences because the pulse head and tail experience dissimilar space charge effects. Thus IOT beam formation is fundamentally time dependent (i.e. non-harmonic) and requires, at minimum, electrostatic particle-in-cell techniques for accurate simulation.
Keywords :
anodes; cathodes; electron guns; microwave tubes; IOT electron guns; IOT/MBIOT design; anode-cathode gap; beam generation; cathode-grid region; electromagnetic codes; electron transit delay; electrostatic particle-in-cell technique; inductive output tubes; space charge effect; Analytical models; Computational modeling; Delay; Electromagnetic analysis; Electron beams; Electron emission; Electron guns; Pulse shaping methods; Shape; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
Type :
conf
DOI :
10.1109/IVELEC.2010.5503496
Filename :
5503496
Link To Document :
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