Title :
11.6: Emission characterization of diamond current amplifier
Author :
Yater, Joan E. ; Shaw, Jonathan L. ; Jensen, Kevin L. ; Myers, Robert E. ; Butler, James E. ; Pate, Bradford B. ; Feygelson, Tatyana
Author_Institution :
Electron. Sci. & Technol. Div., Naval Res. Lab., Washington, DC, USA
Abstract :
Secondary-electron-emission measurements are used to examine the transport and emission characteristics of an 8.3-micron-thick diamond amplifier film. Superior transport and emission properties are confirmed for the single-crystal CVD diamond compared to previously-studied polycrystalline diamond. In particular, low-energy secondary electrons are emitted from the conduction band even after diffusing through the entire 8-micron-thick film. In the initial field-free measurements, the gain is limited by diffusive transport but it should increase greatly upon biasing the amplifier.
Keywords :
amplifiers; conduction bands; diamond; diffusion; secondary electron emission; C; conduction band; diamond amplifier film; diamond current amplifier; diffusion; diffusive transport; initial field-free measurements; low-energy secondary electrons; secondary-electron-emission measurements; single-crystal CVD diamond; Cathodes; Chemistry; Conductive films; Electron beams; Electron emission; Energy measurement; Gain measurement; Laboratories; Optical films; Optical reflection; current amplifier; diamond; electron transport; negative electron affinity; secondary emission;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
DOI :
10.1109/IVELEC.2010.5503527
