DocumentCode :
2926998
Title :
11.4: Examination of field emission from copper knife edge cathodes with low-work function coatings
Author :
Sule, Nishant ; Kirley, Matt ; Novakovic, Bozidar ; Scharer, John ; Knezevic, Irena ; Booske, John H.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Wisconsin-Madison, Madison, WI, USA
fYear :
2010
fDate :
18-20 May 2010
Firstpage :
207
Lastpage :
208
Abstract :
We report experiments and analysis of field emission from copper knife-edge (CKE) cathodes, both bare and coated with low work function (~2.5 eV) Lanthanum hexaboride (LaB6) thin films. The bare CKE cathode exhibits evidence of space charge limited emission currents at high field strengths. The LaB6 coated cathodes exhibit a nonlinear Fowler-Nordhiem (FN) type emission. An intermediate saturation region is observed from field emission data, which is more prominent at elevated (185 C) temperature. Surprisingly, the LaB6 coated cathodes are observed to emit less current than the higher work function (> 4 eV) bare CKE cathode. A hypothesis and corresponding model including both field emission and solid state electron transport from the Cu substrate, through the LaB6 thin film, is proposed to explain the experimental observations.
Keywords :
cathodes; coatings; electron field emission; lanthanum compounds; thin films; work function; CKE cathodes; Cu substrate; LaB6; coated cathodes; copper knife edge cathodes; field emission; intermediate saturation region; lanthanum hexaboride thin films; low-work function coatings; nonlinear Fowler-Nordhiem type emission; solid state electron transport; space charge limited emission currents; work function; Cathodes; Coatings; Copper; Electron emission; Lanthanum; Solid modeling; Solid state circuits; Space charge; Temperature; Transistors; Field emission; cold cathode; knife-edge cathode; lanthanum hexaboride;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
Type :
conf
DOI :
10.1109/IVELEC.2010.5503529
Filename :
5503529
Link To Document :
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