• DocumentCode
    2927057
  • Title

    Microwave noise figure in MESFETs and HEMTs with kink-effect and (or) parallel conduction

  • Author

    Reynoso-Hernandez, J.A. ; Escotte, L. ; Plana, R. ; Graffeuil, J.

  • Author_Institution
    CICESE, Ensenada, Mexico
  • fYear
    1992
  • fDate
    1-5 June 1992
  • Firstpage
    289
  • Abstract
    The authors consider the influence of the kink effect often noticed in MESFETs and HEMTs (high electron mobility transistors) and the parallel conduction sometimes observed in HEMTs on the microwave noise figure. It is found that the kink effect mostly affects MESFET noise and that parallel conduction affects HEMT noise, especially when operated at large drain current. Consequences for optimal bias conditions for low noise amplifiers are outlined.<>
  • Keywords
    Schottky gate field effect transistors; high electron mobility transistors; semiconductor device noise; solid-state microwave devices; HEMTs; LNA bias; MESFETs; high electron mobility transistors; kink-effect; low noise amplifiers; microwave noise figure; optimal bias conditions; parallel conduction; FETs; Gallium arsenide; HEMTs; Impact ionization; MESFETs; MODFETs; Noise figure; PHEMTs; Transconductance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1992., IEEE MTT-S International
  • Conference_Location
    Albuquerque, NM, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-0611-2
  • Type

    conf

  • DOI
    10.1109/MWSYM.1992.187969
  • Filename
    187969