Title :
Fiber-optic microsensors to measure backscattered light intensity in biofilms
Author :
Beyenal, H. ; Lewandowski, Z. ; Yakymyshyn, C. ; Lemley, B. ; Wehri, J.
Author_Institution :
Center for Biofilm Eng., Montana State Univ., Bozeman, MT, USA
Abstract :
Summary form only given. Biofilms are a predominant microbial growth mode in natural and engineered systems. Biofilm processes are implicated in bioremediation of toxic compounds, oral hygiene, souring of oil formations, microbially influenced corrosion, and infection of prosthetic devices. To evaluate metabolic activity of biofilm microorganisms it is imperative to measure chemical gradients of nutrient concentration across microbial deposits less than a few hundred microns thick. Micro-scale fiber-optic sensors have several potential advantages. They are immune to electromagnetic noise, need no reference electrodes and are easier to fabricate. We have developed a fiber-optic microsensor based on commercially available optical telecommunications components that measures backscattered light from a tapered fiber tip. The biofilm preparation and standard measurement techniques are described elsewhere.
Keywords :
backscatter; biomembranes; biosensors; fibre optic sensors; light scattering; microsensors; backscattered light intensity measurement; backscattered light measurement; biofilm preparation; biofilm processes; biofilms; bioremediation; chemical gradients; commercially available optical telecommunications components; electromagnetic noise; fiber-optic microsensor; fiber-optic microsensors; micro-scale fiber-optic sensors; microbial deposits; microbial growth mode; microbially influenced corrosion; nutrient concentration; oral hygiene; prosthetic device infection; reference electrodes; standard measurement techniques; tapered fiber tip; toxic compounds; Corrosion; Electromagnetic measurements; Microorganisms; Microsensors; Optical fiber devices; Optical fiber sensors; Optical noise; Petroleum; Prosthetics; Systems engineering and theory;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.907233