DocumentCode
2927327
Title
Dependable VLSI: Device, design and architecture - How should they cooperate?
Author
Sakai, Shuichi ; Onodera, Hidetoshi ; Yasuura, Hiroto ; Hoe, James C.
Author_Institution
Univ. of Tokyo, Tokyo
fYear
2009
fDate
19-22 Jan. 2009
Firstpage
859
Lastpage
860
Abstract
VLSI dependability is one of the most significant issues in the modern world. Here the panelists will discuss the key technologies for it as well as the cost optimization among device, design and architecture.
Keywords
VLSI; costing; integrated circuit design; integrated circuit reliability; VLSI dependability; VLSI design; cost optimization; very large scale integration architecture; Availability; Computer architecture; Cost function; Cryptography; Design optimization; Load flow control; Protection; Redundancy; Safety; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
978-1-4244-2748-2
Electronic_ISBN
978-1-4244-2749-9
Type
conf
DOI
10.1109/ASPDAC.2009.4796588
Filename
4796588
Link To Document