DocumentCode :
2927708
Title :
P1–20: A comparison of model thin film scandate cathode surfaces
Author :
Vaughn, Joel M. ; Jamison, Keith D. ; Kordesch, Martin E.
Author_Institution :
Dept. of Phys. & Astron., Ohio Univ., Athens, OH, USA
fYear :
2010
fDate :
18-20 May 2010
Firstpage :
139
Lastpage :
140
Abstract :
Thin film model cathodes prepared as 200nm nominally thick sputter deposited coatings in many configurations of Sc, Sc2O3, Ba, BaO on W foil (0.05mm thick) were studied using photoelectron emission microcopy (PEEM) and thermionic emission microscopy (ThEEM) in a BauerTelieps style LEEM/PEEM.
Keywords :
barium compounds; cathodes; photoelectron microscopy; scandium compounds; sputtered coatings; thermionic emission; thin film devices; tungsten; BaO; BauerTelieps style LEEM/PEEM; Sc2O3; ThEEM; W; W foil; photoelectron emission microcopy; size 0.05 mm; size 200 nm; thermionic emission microscopy; thick sputter deposited coatings; thin film scandate cathode surfaces; Atomic layer deposition; Barium; Brightness temperature; Cathodes; Current density; Current measurement; Density measurement; Photoelectron microscopy; Temperature measurement; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
Type :
conf
DOI :
10.1109/IVELEC.2010.5503563
Filename :
5503563
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2927708
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