DocumentCode
2927867
Title
P1–15: Simulation and test of filter loaded three gap coupled output cavities
Author
Wang, Shuzhong
Author_Institution
Key Lab. of High Power Microwave Sources & Technol., Chinese Acad. of Sci., Beijing, China
fYear
2010
fDate
18-20 May 2010
Firstpage
129
Lastpage
130
Abstract
The real part of gap impedance reflect the bandwidth of the coupled output cavities. Group delay time also have some relation with the bandwidth. In the simulation, group delay time can be taken as a basic reference, then field analysis method was used to calculate the real part of total gap impedance, thus plenty of time can be saved. We also test the group delay time characteristic using the vector network analyzer and obtain a cold test result.
Keywords
circuit testing; filters; klystrons; simulation; cold test; filter; gap coupled output cavities; gap impedance; group delay time characteristic; simulation; vector network analyzer; Bandwidth; Circuit testing; Coupling circuits; Delay effects; Electronic equipment testing; Filters; Frequency; Impedance; Klystrons; Millimeter wave technology; bandwidth; coupled output cavities; filter;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4244-7098-3
Type
conf
DOI
10.1109/IVELEC.2010.5503570
Filename
5503570
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