• DocumentCode
    2927867
  • Title

    P1–15: Simulation and test of filter loaded three gap coupled output cavities

  • Author

    Wang, Shuzhong

  • Author_Institution
    Key Lab. of High Power Microwave Sources & Technol., Chinese Acad. of Sci., Beijing, China
  • fYear
    2010
  • fDate
    18-20 May 2010
  • Firstpage
    129
  • Lastpage
    130
  • Abstract
    The real part of gap impedance reflect the bandwidth of the coupled output cavities. Group delay time also have some relation with the bandwidth. In the simulation, group delay time can be taken as a basic reference, then field analysis method was used to calculate the real part of total gap impedance, thus plenty of time can be saved. We also test the group delay time characteristic using the vector network analyzer and obtain a cold test result.
  • Keywords
    circuit testing; filters; klystrons; simulation; cold test; filter; gap coupled output cavities; gap impedance; group delay time characteristic; simulation; vector network analyzer; Bandwidth; Circuit testing; Coupling circuits; Delay effects; Electronic equipment testing; Filters; Frequency; Impedance; Klystrons; Millimeter wave technology; bandwidth; coupled output cavities; filter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2010 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-7098-3
  • Type

    conf

  • DOI
    10.1109/IVELEC.2010.5503570
  • Filename
    5503570