Title :
Non linear optical properties of Silicon nanocrystals for applications in photonic logic gates devices.
Author :
Spano, R. ; Cazzanelli, M. ; Daldosso, N. ; Tartara, L. ; Yu, J. ; Degiorgio, V. ; Hernandez, S. ; Lebour, Y. ; Pellegrino, P. ; Garrido, B. ; Jordana, E. ; Fedeli, J.M. ; Pavesi, L.
Author_Institution :
Dipt. di Fis., Univ. di Trento, Trento
Abstract :
A systematic study of silicon nanocrystals (Si-ncs) nonlinearities at 1550 nm was carried out in view of the realization of an all optical Mach-Zehender interferometer (MZI).
Keywords :
Mach-Zehnder interferometers; elemental semiconductors; nanostructured materials; nonlinear optics; optical logic; optical materials; silicon; Si; all optical Mach-Zehender interferometer; nonlinear optical properties; photonic logic gates device; silicon nanocrystals; wavelength 1550 nm; Atom optics; Logic devices; Logic gates; Nanocrystals; Nonlinear optics; Optical devices; Optical distortion; Optical interferometry; Optical refraction; Silicon;
Conference_Titel :
IEEE/LEOS Winter Topical Meeting Series, 2008
Conference_Location :
Sorrento
Print_ISBN :
978-1-4244-1594-6
Electronic_ISBN :
978-1-4244-1595-3
DOI :
10.1109/LEOSWT.2008.4444374
