DocumentCode :
2928298
Title :
Dielectric breakdown of amorphous and semicrystalline polymers
Author :
Couderc, H. ; David, E. ; Corlu, Y. ; Fréchette, M. ; Savoie, S.
Author_Institution :
Ecole de Technol. Super., Montréal, ON, Canada
fYear :
2011
fDate :
5-8 June 2011
Firstpage :
454
Lastpage :
458
Abstract :
Dielectric breakdown and endurance of polymers have been of great interest for researchers since years. Procedures for the determination of the dielectric strength at power commercial frequencies of solid insulating material are various and will often give different results. This paper presents short-term dielectric breakdown measurements for two different insulating materials at various thicknesses. The effect of thickness, surrounding medium and crystallinity is discussed.
Keywords :
dielectric measurement; electric breakdown; insulating materials; amorphous polymers; semicrystalline polymers; short-term dielectric breakdown measurements; solid insulating material; Crystallization; Dielectric breakdown; Electrodes; Films; Polyethylene; Breakdown procedure; cristallinity; thickness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation Conference (EIC), 2011
Conference_Location :
Annapolis, MD
ISSN :
pending
Print_ISBN :
978-1-4577-0278-5
Electronic_ISBN :
pending
Type :
conf
DOI :
10.1109/EIC.2011.5996197
Filename :
5996197
Link To Document :
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