DocumentCode
2928337
Title
Imaging of the behavior of atoms and emissive species in laser-induced forward transfer process
Author
Nakata, Y. ; Okada, Takashi ; Maeda, Munenori
Author_Institution
Graduate Sch. of Inf. Sci. & Electr. Eng., Kyushu Univ., Fukuoka, Japan
fYear
2000
fDate
7-12 May 2000
Firstpage
493
Lastpage
494
Abstract
Summary form only given. Laser-induced forward transfer (LIFT) is a technique for fabricating micron-sized thin film, and can be applied to the mending or writing an electrical circuit or the fabrication of micro machine etc. The process of LIFT has not been well understood, so it has been optimized by a trial and error method. To understand and control the process, understanding of the particle behavior in LIFT process is essential. In the experiment, the behaviors of atoms and emissive species in LIFT process were firstly visualized by two-dimensional laser-induced fluorescence (2D-LIF) and imaging of thermal radiation. To observe the micron-sized LIFT process, a long-working distance microscope was used.
Keywords
CCD image sensors; cameras; fluorescence; gold; infrared imaging; laser ablation; metallic thin films; optimisation; photoluminescence; Au; Au thin films; atoms; electrical circuit; emissive species; fabrication; imaging; laser-induced forward transfer process; long-working distance microscope; mending; micro machine; micron-sized laser-induced forward transfer process; micron-sized thin film; optimized; particle behavior; thermal radiation; trial and error method; two-dimensional laser-induced fluorescence; writing; Atom lasers; Atomic beams; Atomic measurements; Fluorescence; Optical device fabrication; Optimization methods; Process control; Thin film circuits; Visualization; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
1-55752-634-6
Type
conf
DOI
10.1109/CLEO.2000.907297
Filename
907297
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