DocumentCode
292837
Title
A CAD environment for performance and yield driven circuit design employing electromagnetic field simulators
Author
Bandler, J.W. ; Biernacki, R.M. ; Chen, S.H. ; Grobelny, P.A.
Author_Institution
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
Volume
1
fYear
1994
fDate
30 May-2 Jun 1994
Firstpage
145
Abstract
In this paper we describe a CAD environment for performance and yield driven circuit design with electromagnetic (EM) field simulations employed within the optimization loop. Microstrip structures are accurately simulated and their responses are incorporated into the overall circuit analysis. We unify the component level interpolation technique, devised to handle discretization of geometrical parameters, and the modeling technique used to lighten the computational burden of statistical design centering. We discuss the organization and utilization of the data base system integrated with the modeling technique. We demonstrate the feasibility and benefits of performance and yield optimization with EM simulations
Keywords
circuit CAD; circuit analysis computing; circuit optimisation; integrated circuit yield; interpolation; microstrip circuits; microwave circuits; CAD environment; component level interpolation technique; discretization; electromagnetic field simulators; geometrical parameters; microstrip structures; modeling technique; optimization loop; overall circuit analysis; performance optimization; statistical design centering; yield driven circuit design; Analytical models; Circuit analysis; Circuit simulation; Circuit synthesis; Computational modeling; Design automation; Design optimization; Electromagnetic fields; Interpolation; Microstrip;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location
London
Print_ISBN
0-7803-1915-X
Type
conf
DOI
10.1109/ISCAS.1994.408776
Filename
408776
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