DocumentCode :
2928499
Title :
Fast mode selection scheme for H.264/AVC inter prediction based on statistical learning method
Author :
Ma, Weipeng ; Yang, Shuyuan ; Gao, Li ; Pei, Chaoke ; Yan, Shefeng
Author_Institution :
Grad. Univ. of Chinese Acad. of Sci., Beijing, China
fYear :
2009
fDate :
June 28 2009-July 3 2009
Firstpage :
17
Lastpage :
20
Abstract :
H.264 adopts variable block size motion estimation and rate-distortion-optimization based mode decision to improve video quality and compression ratio. These techniques have made H.264 better than other existing video coding standards. However, they are computationally intensive and time-consuming. In this paper, a fast mode selection scheme is proposed for H.264 inter prediction. Firstly, the first few frames are encoded and thresholds are acquired through a statistical learning process. Then, for the rest of frames, motion estimation and mode decision are only performed for the candidate modes which are selected with the proposed fast mode selection scheme. The proposed approach is applicable to all existing motion search algorithms. Besides, thresholds are on-line computed separately for each sequence. Results show that the total encoding time is saved by 57.2% on average with negligible video quality degradation.
Keywords :
code standards; data compression; image segmentation; image sequences; learning (artificial intelligence); motion estimation; optimisation; rate distortion theory; statistical analysis; video coding; H.264/AVC inter prediction; fast mode selection scheme; inter mode decision; rate-distortion-optimization; statistical learning method; variable block size motion estimation; video coding standard; video compression ratio; video quality; video sequence; video threshold; Automatic voltage control; Chaos; Costs; Digital systems; Encoding; Lagrangian functions; Motion estimation; Statistical learning; Video coding; Video compression; H.264/AVC; inter mode decision; video coding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
Conference_Location :
New York, NY
ISSN :
1945-7871
Print_ISBN :
978-1-4244-4290-4
Electronic_ISBN :
1945-7871
Type :
conf
DOI :
10.1109/ICME.2009.5202425
Filename :
5202425
Link To Document :
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