DocumentCode
2928553
Title
Session 8: Modeling and simulation - advances in modeling low dimensional structures
Author
Iannaccone, Giuseppe
Author_Institution
University of Pisa, Pierpaolo Palestri, University of Udine, Italy
fYear
2008
fDate
15-17 Dec. 2008
Firstpage
1
Lastpage
1
Abstract
This session presents recent advances in the simulation of low dimensional structures. The session begins with an invited paper by Klimeck et al., from Purdue. This paper reviews the progress towards atomistic 3D quantum transport of nano-scale semiconductor devices. Betti et al., from University of Pisa will then address shot noise in quasi one-dimensional FETs. The impact of strain on GeSi core shell nano-wire FETs is the subject of the next paper by He et al., from Peking University. The fourth paper by Khayer et al., from the University of California at Riverside analyzes the quantum capacitance limit in InSb nano-wires. Guan and other investigators from Stanford and Tsinghua Universities focus next on atomistic simulations of graphene nano-ribbon - metal contacts. The potential of graphene nano-ribbons as interconnects is the subject of a paper by Xu et al., from the University of California at Santa Barbara.
Keywords
Capacitive sensors; FETs; Germanium silicon alloys; Helium; Nanoscale devices; Nanowires; Quantum capacitance; Semiconductor device noise; Semiconductor devices; Silicon germanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2008. IEDM 2008. IEEE International
Conference_Location
San Francisco, CA, USA
ISSN
8164-2284
Print_ISBN
978-1-4244-2377-4
Electronic_ISBN
8164-2284
Type
conf
DOI
10.1109/IEDM.2008.4796646
Filename
4796646
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