• DocumentCode
    2928553
  • Title

    Session 8: Modeling and simulation - advances in modeling low dimensional structures

  • Author

    Iannaccone, Giuseppe

  • Author_Institution
    University of Pisa, Pierpaolo Palestri, University of Udine, Italy
  • fYear
    2008
  • fDate
    15-17 Dec. 2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This session presents recent advances in the simulation of low dimensional structures. The session begins with an invited paper by Klimeck et al., from Purdue. This paper reviews the progress towards atomistic 3D quantum transport of nano-scale semiconductor devices. Betti et al., from University of Pisa will then address shot noise in quasi one-dimensional FETs. The impact of strain on GeSi core shell nano-wire FETs is the subject of the next paper by He et al., from Peking University. The fourth paper by Khayer et al., from the University of California at Riverside analyzes the quantum capacitance limit in InSb nano-wires. Guan and other investigators from Stanford and Tsinghua Universities focus next on atomistic simulations of graphene nano-ribbon - metal contacts. The potential of graphene nano-ribbons as interconnects is the subject of a paper by Xu et al., from the University of California at Santa Barbara.
  • Keywords
    Capacitive sensors; FETs; Germanium silicon alloys; Helium; Nanoscale devices; Nanowires; Quantum capacitance; Semiconductor device noise; Semiconductor devices; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2008. IEDM 2008. IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    8164-2284
  • Print_ISBN
    978-1-4244-2377-4
  • Electronic_ISBN
    8164-2284
  • Type

    conf

  • DOI
    10.1109/IEDM.2008.4796646
  • Filename
    4796646