• DocumentCode
    292870
  • Title

    Detecting hard faults with combined approximate forward/backward symbolic techniques

  • Author

    Cabodi, Gianpiero ; Camurati, Paolo ; Quer, Stefano

  • Author_Institution
    Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
  • Volume
    1
  • fYear
    1994
  • fDate
    30 May-2 Jun 1994
  • Firstpage
    299
  • Abstract
    Symbolic state space exploration techniques proved to be useful not only in formal verification and synthesis, but also in testing. Most of them are based on exact forward or backward traversal. As an alternative, approximate forward traversal algorithms have been proposed, but they are not immediately applicable to test pattern generation. This paper presents strategies for approximate forward traversal, then it combines approximate forward traversal and backward traversal for generating test patterns for hard to detect faults. Efficient search space pruning is obtained by means of cofactoring. Experimental results show that the speed up ranges from 2 to more than 50
  • Keywords
    automatic testing; logic testing; state-space methods; symbolic substitution; ATPG; approximate forward/backward symbolic techniques; cofactoring; hard faults detection; search space pruning; symbolic state space exploration techniques; test pattern generation; testing; Automata; Automatic test pattern generation; Automatic testing; Circuit faults; Fault detection; Formal verification; Redundancy; Space exploration; State-space methods; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-1915-X
  • Type

    conf

  • DOI
    10.1109/ISCAS.1994.408814
  • Filename
    408814