On-wafer testing of MMIC with monolithically integrated photoconductive switches

Author

Huang, S.L. ; Chauchard, E.A. ; Lee, C.H. ; Lee, T.T. ; Hung, H.-L.A. ; Joseph, T.

Author_Institution

Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA

fYear

1992

fDate

1-5 June 1992

Firstpage

661

Abstract

The authors present on-wafer photoconductive sampling and characterization of a monolithic microwave integrated circuit (MMIC) with a monolithically integrated optical test structure. Reasonable agreement has been achieved between the conventional network analyzer measurement and two optical test results. The S-parameter characterization of a nonlinear transmission line has also been demonstrated.<>

Keywords

MMIC; S-parameters; integrated circuit testing; integrated optoelectronics; photoconducting devices; semiconductor switches; transmission lines; MMIC testing; S-parameter characterization; monolithic microwave integrated circuit; monolithically integrated optical test structure; monolithically integrated photoconductive switches; network analyzer measurement; nonlinear transmission line; on-wafer characterization; on-wafer photoconductive sampling; on-wafer testing; optical test results; Circuit testing; Integrated circuit testing; Integrated optics; MMICs; Microwave integrated circuits; Monolithic integrated circuits; Nonlinear optics; Photoconducting devices; Photonic integrated circuits; Sampling methods;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1992., IEEE MTT-S International

Conference_Location

Albuquerque, NM, USA

ISSN

0149-645X

Print_ISBN

0-7803-0611-2

Type

conf

DOI

10.1109/MWSYM.1992.188070

Filename

188070