DocumentCode
292882
Title
Transient simulation of coupled lossy interconnects by window partitioning technique
Author
BANDI, Vijaya Gopal ; Asai, Hideki
Author_Institution
Fac. of Eng., Shizuoka Univ., Hamamatsu, Japan
Volume
1
fYear
1994
fDate
30 May-2 Jun 1994
Firstpage
419
Abstract
A new algorithm, which is incorporated into the waveform relaxation analysis, to compute the transient response of coupled lossy transmission lines is presented. First, coupled lines are transformed into uncoupled lines by a transformation network. Second, each uncoupled line is modelled into an equivalent disjoint two-port network. This model, called characteristic model, consists of characteristic impedances and voltage generators in each branch. Synthesized networks are used to represent characteristic impedances and attenuation functions. Finally, the circuit is partitioned into two subcircuits and waveform relaxation analysis is carried out in sequential time windows of size equal to the delay of an uncoupled line with fastest propagation velocity. By this approach, the near end and far end subcircuits are totally decoupled within each window and as a result converged waveforms are obtained with a single iteration
Keywords
circuit analysis computing; distributed parameter networks; equivalent circuits; integrated circuit interconnections; iterative methods; transient analysis; transient response; transmission line theory; attenuation functions; characteristic impedances; characteristic model; coupled lossy interconnects; equivalent disjoint two-port network; lossy transmission lines; transient response; transient simulation; voltage generators; waveform relaxation analysis; window partitioning technique; Algorithm design and analysis; Computational modeling; Couplings; Impedance; Integrated circuit interconnections; Power system transients; Propagation losses; Transient response; Transmission lines; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location
London
Print_ISBN
0-7803-1915-X
Type
conf
DOI
10.1109/ISCAS.1994.408828
Filename
408828
Link To Document