Title :
A novel method for the fault detection of analog integrated circuits
Author :
Wang, ZhiHua ; Gielen, Georges ; Sansen, Willy
Author_Institution :
Dept. of Electr. Eng., Katholieke Univ., Leuven, Heverlee, Belgium
fDate :
30 May-2 Jun 1994
Abstract :
A novel method for the fault detection of analog circuits is proposed. Simple measurements are used to detect the possible faults in an analog circuit. Bayes decision rule is applied to combine the priori information and the information from testing. A sequential method to evaluate the value of the priori probability is given. Principle component analysis is applied for the calculation of the discrimination function in the case of the measurements being dependent. Examples are given to demonstrate the efficiency and the effectiveness of the algorithm
Keywords :
Bayes methods; analogue integrated circuits; automatic testing; circuit analysis computing; fault location; integrated circuit testing; probability; Bayes decision rule; analog integrated circuits; discrimination function; fault detection; principle component analysis; priori probability; sequential method; Analog circuits; Analog integrated circuits; Circuit faults; Circuit testing; Electrical fault detection; Fabrication; Fault detection; Integrated circuit measurements; Probes; Semiconductor device measurement;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.408868
