A novel method for the fault detection of analog integrated circuits

Author

Wang, ZhiHua ; Gielen, Georges ; Sansen, Willy

Author_Institution

Dept. of Electr. Eng., Katholieke Univ., Leuven, Heverlee, Belgium

Volume

1

fYear

1994

fDate

30 May-2 Jun 1994

Firstpage

347

Abstract

A novel method for the fault detection of analog circuits is proposed. Simple measurements are used to detect the possible faults in an analog circuit. Bayes decision rule is applied to combine the priori information and the information from testing. A sequential method to evaluate the value of the priori probability is given. Principle component analysis is applied for the calculation of the discrimination function in the case of the measurements being dependent. Examples are given to demonstrate the efficiency and the effectiveness of the algorithm

Keywords

Bayes methods; analogue integrated circuits; automatic testing; circuit analysis computing; fault location; integrated circuit testing; probability; Bayes decision rule; analog integrated circuits; discrimination function; fault detection; principle component analysis; priori probability; sequential method; Analog circuits; Analog integrated circuits; Circuit faults; Circuit testing; Electrical fault detection; Fabrication; Fault detection; Integrated circuit measurements; Probes; Semiconductor device measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on

Conference_Location

London

Print_ISBN

0-7803-1915-X

Type

conf

DOI

10.1109/ISCAS.1994.408868

Filename

408868