• DocumentCode
    2929199
  • Title

    Integrated Data Processing for PSP/TSP/S3F and model deformation measurements

  • Author

    Fonov, V. ; Crafton, G. ; Goss, L. ; Fonov, S.

  • Author_Institution
    McConnell Brain Imaging Center, Montreal Neurological Institute, McGill University, 3801 University Street Montreal, Quebec, Canada H3A 2T5
  • fYear
    2005
  • fDate
    2005
  • Firstpage
    128
  • Lastpage
    134
  • Abstract
    This paper reviews data processing algorithms used for data registration with Pressure Sensitive Paint (PSP), Shear and Stress Sensitive Film (S3F) and model deformation estimation. Accuracy of the registration algorithm was experimentally estimated in production environment. The paper also includes results of the simultaneous PSP measurement and model deformation estimation of UCAV model and comparison of pressure fields recovered using PSP and S3F technique on the half delta wing model.
  • Keywords
    Deformation measurements; Pressure-Sensitive Paints; Shear Measurements; Aerodynamics; Brain modeling; Computational fluid dynamics; Data processing; Deformable models; Distortion measurement; Paints; Particle measurements; Pressure measurement; Stress measurement; Deformation measurements; Pressure-Sensitive Paints; Shear Measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation in Aerospace Simulation Facilities, 2005. iciasf '05. 21st International Congress on
  • Print_ISBN
    0-7803-9096-2
  • Type

    conf

  • DOI
    10.1109/ICIASF.2005.1569914
  • Filename
    1569914