DocumentCode
2929199
Title
Integrated Data Processing for PSP/TSP/S3F and model deformation measurements
Author
Fonov, V. ; Crafton, G. ; Goss, L. ; Fonov, S.
Author_Institution
McConnell Brain Imaging Center, Montreal Neurological Institute, McGill University, 3801 University Street Montreal, Quebec, Canada H3A 2T5
fYear
2005
fDate
2005
Firstpage
128
Lastpage
134
Abstract
This paper reviews data processing algorithms used for data registration with Pressure Sensitive Paint (PSP), Shear and Stress Sensitive Film (S3F) and model deformation estimation. Accuracy of the registration algorithm was experimentally estimated in production environment. The paper also includes results of the simultaneous PSP measurement and model deformation estimation of UCAV model and comparison of pressure fields recovered using PSP and S3F technique on the half delta wing model.
Keywords
Deformation measurements; Pressure-Sensitive Paints; Shear Measurements; Aerodynamics; Brain modeling; Computational fluid dynamics; Data processing; Deformable models; Distortion measurement; Paints; Particle measurements; Pressure measurement; Stress measurement; Deformation measurements; Pressure-Sensitive Paints; Shear Measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation in Aerospace Simulation Facilities, 2005. iciasf '05. 21st International Congress on
Print_ISBN
0-7803-9096-2
Type
conf
DOI
10.1109/ICIASF.2005.1569914
Filename
1569914
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