DocumentCode
2930140
Title
Detection of micro-Te segregation at the interface of Cu/Cr phases in Cu-30Cr-0.01Te alloy contact material by XPS
Author
Xie, Jinglin ; Miao, Baihe
Author_Institution
Anal. Instrum. Center, Peking Univ., Beijing, China
fYear
2011
fDate
23-27 Oct. 2011
Firstpage
215
Lastpage
218
Abstract
The composition and bonding energy of Te segregation in Cu-30Cr-0.01Te alloy contact material were investigated by X-ray photoelectron spectroscopy. Photoelectron patterns from the main chemical elements of Cu, Cr and Te on the fresh fracture surface of Cu-30Cr-0.01Te alloy contact material show that Te atoms highly segregated at the interface of Cu/Cr phases, thus the structure and property of the interface between Cu/Cr phases were changed and led to reduce the tensile strength and increase anti-welding property of the contact material.
Keywords
X-ray photoelectron spectra; chromium alloys; copper alloys; electrical contacts; segregation; tellurium alloys; Cu-Cr-Te; X-ray photoelectron spectroscopy; XPS; antiwelding property; bonding energy; contact material; photoelectron patterns; tellurium segregation; tensile strength; Copper; Materials; Spectroscopy; Surface cracks; Surface treatment; Three dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Electric Power Equipment - Switching Technology (ICEPE-ST), 2011 1st International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4577-1273-9
Type
conf
DOI
10.1109/ICEPE-ST.2011.6122972
Filename
6122972
Link To Document