Title :
MM-wave surface resistance measurements of HTS films using a highly sensitive cavity
Author :
Mayer, B. ; Knochel, R.
Author_Institution :
Arbeitsbereich Hochfrequenztech., Tech. Univ. Hamburg-Harburg, Germany
Abstract :
For the precise measurement of surface resistance of HTSs (high-temperature superconductors), a systematic design theory for truncated cone cavities is given. This kind of cavity avoids mode degeneration, which is a problem if cylindrical cavities are used. Also, if offers a considerably higher sensitivity with regard to surface resistance measurements. A measurement system at 52 GHz is described and results for three samples are given. The residual resistances of the three films were in the range of 5 m Omega to 10 m Omega at 52 GHz. A measurement accuracy of +or-0.5 m Omega has been achieved.<>
Keywords :
cavity resonators; electric resistance measurement; high-temperature superconductors; microwave measurement; superconducting thin films; surface conductivity; 5 to 10 mohm; 52 GHz; HTS films; MM-wave surface resistance; high-temperature superconductors; highly sensitive cavity; measurement accuracy; residual resistances; truncated cone cavities; Distortion measurement; Electrical resistance measurement; Frequency measurement; High temperature superconductors; Q factor; Resonance; Resonant frequency; Shape; Superconducting films; Surface resistance;
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-0611-2
DOI :
10.1109/MWSYM.1992.188161
