Title :
Resource-adaptive semantic concept detection using ensemble classifiers
Author :
Turaga, D.S. ; Yan, R.
Author_Institution :
T.J. Watson Res. Center, IBM, Hawthorne, NY, USA
fDate :
June 28 2009-July 3 2009
Abstract :
We propose a new approach for resource-adaptive semantic concept detection on image streams. We build concept detectors using an ensemble learning method called random subspace bagging, and deploy them on a set of distributed processing nodes. We focus on the optimal placement of ensemble classifiers across nodes, and selection of the number of base models for each classifier, to maximize classification performance while adapting to resource constraints. Based on a utility metric defined in terms of misclassification probabilities, we formulate this resource adaptation problem using two approaches. The first corresponds to a Multiple-Choice-Multiple-Knapsack problem solved by integer programming, while the second involves formulation as a load-balancing problem solved by linear programming. The performance of these approaches is evaluated on an application that detects 10 semantic concepts on real image streams. We show that the load-balancing approach outperforms the knapsack approach, with over 60% reduction in misclassification penalty under tight resource constraints.
Keywords :
distributed processing; image classification; integer programming; knapsack problems; learning (artificial intelligence); linear programming; resource allocation; distributed processing; ensemble classifiers; ensemble learning method; image streams; integer programming; linear programming; load-balancing problem; multiple-choice-multiple-knapsack problem; random subspace bagging; resource adaptation problem; resource constraints; resource-adaptive semantic concept detection; Bagging; Detectors; Distributed processing; Large-scale systems; Learning systems; Linear programming; Streaming media; Supervised learning; Support vector machine classification; Support vector machines;
Conference_Titel :
Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
Conference_Location :
New York, NY
Print_ISBN :
978-1-4244-4290-4
Electronic_ISBN :
1945-7871
DOI :
10.1109/ICME.2009.5202521