• DocumentCode
    2930434
  • Title

    New heterogeneous multi-chip module integration technology using self-assembly method

  • Author

    Fukushima, T. ; Konno, T. ; Kiyoyama, K. ; Murugesan, M. ; Sato, K. ; Jeong, W.-C. ; Ohara, Y. ; Noriki, A. ; Kanno, S. ; Kaiho, Y. ; Kino, H. ; Makita, K. ; Kobayashi, R. ; Yin, C.K. ; Inamura, K. ; Lee, K.-W. ; Bea, J.C. ; Tanaka, T. ; Koyanagi, M.

  • Author_Institution
    Dept. of Bioeng. & Robot., Tohoku Univ., Sendai
  • fYear
    2008
  • fDate
    15-17 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We have newly proposed heterogeneous multi-chip module integration technologies in which MEMS and LSI chips are mounted on Si or flexible substrates using a self-assembly method. A large numbers of chips were precisely and simultaneously self-assembled and bonded onto the substrates with high alignment accuracy of approximately 400 nm. Thick MEMS and LSI chips with a thickness of more than 100 mum were electrically connected by unique lateral interconnections formed crossing over chip edges with large step height. We evaluated fundamental electrical characteristics using daisy chains formed crossing over test chips which were face-up bonded onto the substrates by the self-assembly. We obtained excellent characteristics in these daisy chains. In addition, RF test chips with amplitude shift keying (ASK) demodulator and signal processing circuits were self-assembled onto the substrates and electrically connected by the lateral interconnections. We confirmed that these test chips work well.
  • Keywords
    amplitude shift keying; elemental semiconductors; integrated circuit interconnections; integrated circuit packaging; micromechanical devices; multichip modules; self-assembly; silicon; ASK; LSI chips; MEMS; Si; amplitude shift keying demodulator; flexible substrates; interconnections; multichip module integration technology; self-assembly method; signal processing circuits; Amplitude shift keying; Automatic testing; Bonding; Circuit testing; Electric variables; Integrated circuit interconnections; Large scale integration; Micromechanical devices; Radio frequency; Self-assembly;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2008. IEDM 2008. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    8164-2284
  • Print_ISBN
    978-1-4244-2377-4
  • Electronic_ISBN
    8164-2284
  • Type

    conf

  • DOI
    10.1109/IEDM.2008.4796735
  • Filename
    4796735