DocumentCode
2930434
Title
New heterogeneous multi-chip module integration technology using self-assembly method
Author
Fukushima, T. ; Konno, T. ; Kiyoyama, K. ; Murugesan, M. ; Sato, K. ; Jeong, W.-C. ; Ohara, Y. ; Noriki, A. ; Kanno, S. ; Kaiho, Y. ; Kino, H. ; Makita, K. ; Kobayashi, R. ; Yin, C.K. ; Inamura, K. ; Lee, K.-W. ; Bea, J.C. ; Tanaka, T. ; Koyanagi, M.
Author_Institution
Dept. of Bioeng. & Robot., Tohoku Univ., Sendai
fYear
2008
fDate
15-17 Dec. 2008
Firstpage
1
Lastpage
4
Abstract
We have newly proposed heterogeneous multi-chip module integration technologies in which MEMS and LSI chips are mounted on Si or flexible substrates using a self-assembly method. A large numbers of chips were precisely and simultaneously self-assembled and bonded onto the substrates with high alignment accuracy of approximately 400 nm. Thick MEMS and LSI chips with a thickness of more than 100 mum were electrically connected by unique lateral interconnections formed crossing over chip edges with large step height. We evaluated fundamental electrical characteristics using daisy chains formed crossing over test chips which were face-up bonded onto the substrates by the self-assembly. We obtained excellent characteristics in these daisy chains. In addition, RF test chips with amplitude shift keying (ASK) demodulator and signal processing circuits were self-assembled onto the substrates and electrically connected by the lateral interconnections. We confirmed that these test chips work well.
Keywords
amplitude shift keying; elemental semiconductors; integrated circuit interconnections; integrated circuit packaging; micromechanical devices; multichip modules; self-assembly; silicon; ASK; LSI chips; MEMS; Si; amplitude shift keying demodulator; flexible substrates; interconnections; multichip module integration technology; self-assembly method; signal processing circuits; Amplitude shift keying; Automatic testing; Bonding; Circuit testing; Electric variables; Integrated circuit interconnections; Large scale integration; Micromechanical devices; Radio frequency; Self-assembly;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2008. IEDM 2008. IEEE International
Conference_Location
San Francisco, CA
ISSN
8164-2284
Print_ISBN
978-1-4244-2377-4
Electronic_ISBN
8164-2284
Type
conf
DOI
10.1109/IEDM.2008.4796735
Filename
4796735
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