Title :
Mobility extraction and quantum capacitance impact in high performance graphene field-effect transistor devices
Author :
Chen, Zhihong ; Appenzeller, Joerg
Author_Institution :
T.J. Watson Res. Center, IBM, Yorktown Heights, NY
Abstract :
The field-effect mobility of graphene devices is discussed. We argue that the graphene ballistic mean free path, Lball can only be extracted by taking into account both, the electrical characteristics and the channel length dependent mobility. In doing so we find a ballistic mean free path of Lball=300plusmn100 nm at room-temperature for a carrier concentration of ~1012 cm-2 and that a substantial series resistance of around 300 Omega mum has to be taken into account. Furthermore, we demonstrate first quantum capacitance measurements on single-layer graphene devices.
Keywords :
field effect transistors; graphene; ballistic mean free path; carrier concentration; field-effect mobility; high performance graphene field-effect transistor devices; mobility extraction; quantum capacitance; single-layer graphene devices; Capacitance measurement; Carbon nanotubes; Electric resistance; Electric variables; FETs; Immune system; Nanotechnology; Quantum capacitance; Transconductance; Voltage;
Conference_Titel :
Electron Devices Meeting, 2008. IEDM 2008. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2377-4
Electronic_ISBN :
8164-2284
DOI :
10.1109/IEDM.2008.4796737