Characterization of anisotropic substrate materials for microwave applications

Author

Fritsch, U. ; Wolff, I.

Author_Institution

Dept. of Electr. Eng., Duisburg Univ., Germany

fYear

1992

fDate

1-5 June 1992

Firstpage

1131

Abstract

The authors deal with the characterization of uniaxially anisotropic substrates. The determination of permittivity tensors of anisotropic substrates for integrated circuits was performed on the basis of the measured phase constant of a single microstrip line at several frequencies by using an optimization routine and spectral-domain analysis. The investigations have shown that the dispersion characteristics of microstrip lines on isotropic and anisotropic substrate materials, respectively, differ in a manner which allows determination of the permittivity tensor of the substrate material.<>

Keywords

dispersion (wave); microstrip lines; microwave integrated circuits; permittivity; spectral-domain analysis; substrates; 10 to 40 GHz; Al/sub 2/O/sub 3/; alumina; anisotropic substrate materials; dispersion characteristics; integrated circuits; microstrip line; microwave applications; optimization routine; permittivity tensors; phase constant; sapphire; spectral-domain analysis; uniaxially anisotropic substrates; Anisotropic magnetoresistance; Dielectric substrates; Differential equations; Dispersion; Frequency; Green function; Maxwell equations; Microstrip; Permittivity measurement; Tensile stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1992., IEEE MTT-S International

Conference_Location

Albuquerque, NM, USA

ISSN

0149-645X

Print_ISBN

0-7803-0611-2

Type

conf

DOI

10.1109/MWSYM.1992.188193

Filename

188193