Title :
A quantized analog delay for an ir-UWB quadrature downconversion autocorrelation receiver
Author :
Bagga, Sumit ; Zhang, Lujun ; Serdijin, W.A. ; Long, John R. ; Busking, Erik B.
Author_Institution :
Fac. of Electr. Eng., Math. & Comput. Sci., Delft Univ. of Technol., Netherlands
Abstract :
A quantized analog delay is designed as a requirement for the autocorrelation function in the quadrature downconversion autocorrelation receiver (QDAR). The quantized analog delay is comprised of a quantizer, multiple binary delay lines and an adder circuit. Being the foremost element, the quantizer consists of a series of comparators, each one comparing the input signal to a unique reference voltage. The comparator outputs connect to binary delay lines, which are a cascade of synchronized D-latches. The outputs available at each line are linked together to reconstruct the incoming signal using an adder circuit. For a delay time of 550 ps, simulation results in IBM´s CMOS 0.12 μm technology show that the quantized analog delay requires a total current of 36.7 mA at a 1.6 V power supply. Furthermore, delays in the range of several nanoseconds are feasible at the expense of power. After a Monte Carlo simulation it becomes evident that the response of the quantized analog delay does not suffer drastically from neither process nor component mismatch variations.
Keywords :
CMOS integrated circuits; Monte Carlo methods; adders; radio receivers; ultra wideband communication; 0.12 mum; 1.6 V; 36.7 mA; 550 ps; CMOS; Monte Carlo simulation; UWB receivers; adder circuit; impulse radio receivers; multiple binary delay lines; quadrature downconversion autocorrelation receiver; quantized analog delay; Adders; Autocorrelation; Circuits; Delay effects; Delay lines; Frequency; Interference; Narrowband; Pulse modulation; Ultra wideband technology; analog delay; analog integrated circuits; impulse radio; quadrature downconversion autocorrelation receiver; quantizer; ultra-wideband;
Conference_Titel :
Ultra-Wideband, 2005. ICU 2005. 2005 IEEE International Conference on
Print_ISBN :
0-7803-9397-X
DOI :
10.1109/ICU.2005.1570008