Title :
Challenges for embedded electronics in systems used in future facilities dedicated to international physics programs
Author :
Flament, O. ; Baggio, J. ; Bazzoli, S. ; Girard, S. ; Raimbourg, J. ; Sauvestre, J.E. ; Leray, J.L.
Author_Institution :
DIF, CEA, Arpajon, France
Abstract :
The implementation of equipments with embedded electronic to monitor, control, measure and operate future large facilities dedicated to high energy physics or nuclear fusion are necessary. Reliable operation of these equipments will be achieved through availability and reliability analysis. In several cases, the equipment selection or development approach has to be done by considering a harsh environment in terms of radiations. In order to implement these systems in such environments shielding, location and distance from the source must be considered to reduce, to protect and to avoid radiation effects. People in charge of the choice of the equipments have to take into account and mitigate radiation effects from subsystem to system level. This requires an approach integrating tradeoff between performance and reliability, between the use of the state of the art of technologies and robust and well known devices. Experience and knowledge from previous programs should be considered to build approach and strategy that may be necessary to overcome difficulties. In the present paper, we will review the main challenges faced by designers for systems implementation with embedded electronics in future facilities dedicated to international physics programs.
Keywords :
embedded systems; high energy physics instrumentation computing; nuclear electronics; nuclear instrumentation; radiation effects; reliability; shielding; availability; embedded electronics; environment shielding; equipment selection; high energy physics; international physics programs; nuclear fusion; radiation effects; reliability analysis; Availability; Energy measurement; Fusion reactors; Monitoring; Nuclear electronics; Nuclear measurements; Physics; Protection; Radiation effects; Robustness; COTS; Electronics devices; Embedded Electronics; Hardness assurance; Harsh Environment; Optical fibers; Radiation effects;
Conference_Titel :
Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA), 2009 First International Conference on
Conference_Location :
Marseille
Print_ISBN :
978-1-4244-5207-1
Electronic_ISBN :
978-1-4244-5208-8
DOI :
10.1109/ANIMMA.2009.5503741