• DocumentCode
    2931202
  • Title

    Sub-band feature statistics compensation techniques based on discrete wavelet transform for robust speech recognition

  • Author

    Fan, Hao-Teng ; Hung, Jeih-weih

  • Author_Institution
    Dept of Electr. Eng., Nat. Chi Nan Univ., Taiwan
  • fYear
    2009
  • fDate
    June 28 2009-July 3 2009
  • Firstpage
    586
  • Lastpage
    589
  • Abstract
    This paper proposes a novel scheme in performing feature statistics normalization techniques for robust speech recognition. In the proposed approach, the processed temporal-domain feature sequence is first decomposed into non-uniform sub-bands using discrete wavelet transform (DWT), and then each sub-band stream is individually processed by the well-known normalization methods, like mean and variance normalization (MVN) and histogram equalization (HEQ). Finally, we reconstruct the feature stream with all the modified sub-band streams using inverse DWT. With this process, the components that correspond to more important modulation spectral bands in the feature sequence can be processed separately. For the Aurora-2 clean-condition training task, the new proposed sub-band MVN and HEQ provide relative error rate reductions of 20.18% and 19.65% over the conventional MVN and HEQ.
  • Keywords
    discrete wavelet transforms; feature extraction; signal reconstruction; speech recognition; statistical analysis; discrete wavelet transform; histogram equalization method; mean-and-variance normalization method; modulation spectral band; robust speech recognition; signal reconstruction; sub-band feature statistics compensation techniques; temporal-domain feature sequence; Cepstral analysis; Discrete wavelet transforms; Error analysis; Filter bank; Frequency modulation; Higher order statistics; Histograms; Noise robustness; Random variables; Speech recognition; discrete wavelet transform; robust speech feature; speech recognition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
  • Conference_Location
    New York, NY
  • ISSN
    1945-7871
  • Print_ISBN
    978-1-4244-4290-4
  • Electronic_ISBN
    1945-7871
  • Type

    conf

  • DOI
    10.1109/ICME.2009.5202564
  • Filename
    5202564