Title :
Learning super resolution with global and local constraints
Author :
Guo, Kai ; Yang, Xiaokang ; Zhang, Rui ; Yu, Songyu
Author_Institution :
Shanghai Key Lab. of Digital Media Process. & Transm., Shanghai Jiao Tong Univ., Shanghai, China
fDate :
June 28 2009-July 3 2009
Abstract :
In learning based single image super-resolution (SR) approach, the super-resolved image are usually found or combined from training database through patch matching. But because the representation ability of small patch is limited, it is difficult to guarantee that the super-resolved image is best under global view. To tackle this problem, we propose a statistical learning method for SR with both global and local constraints. Firstly, we use maximum a posteriori (MAP) estimation with learned image priors by fields of experts (FoE) model, and regularize SR globally guided by the image priors. Secondly, for each overlapped patch, the higher-order Markov random fields (MRFs) is used to model its local relationship with corresponding high-resolution candidates, then belief propagation is used to find high-resolution image. Compared with traditional patch based learning method without global constraint, our method could not only preserve the global image structure, but also restore the local details well. Experiments verify the idea of our global and local constraint SR method.
Keywords :
Markov processes; image resolution; learning (artificial intelligence); maximum likelihood estimation; statistical analysis; FoE; MAP; belief propagation; fields of experts; global constraint; global image structure; higher-order Markov random fields; local constraint; maximum a posteriori estimation; statistical learning method; super resolution; Belief propagation; Image communication; Image databases; Image resolution; Image restoration; Information processing; Markov random fields; Signal resolution; Spatial databases; Strontium; Fields of Experts (FoE); Super resolution; global constraint; higher-order Markov random fields (hMRFs); local constraint;
Conference_Titel :
Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
Conference_Location :
New York, NY
Print_ISBN :
978-1-4244-4290-4
Electronic_ISBN :
1945-7871
DOI :
10.1109/ICME.2009.5202565