• DocumentCode
    2931914
  • Title

    Classification of apoptosis using advanced clustering techniques on digital microscopic images

  • Author

    Tasoulis, S.K. ; Doukas, C.N. ; Maglogiannis, I. ; Plagianakos, V.P.

  • Author_Institution
    Dept. of Comput. Sci. & Biomed. Inf., Univ. of Central Greece, Lamia, Greece
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 4 2010
  • Firstpage
    5565
  • Lastpage
    5568
  • Abstract
    Programmed cell death, also known as apoptosis is of fundamental importance in many biological processes and also highly associated with serious diseases like cancer and HIV. The current paper presents an innovative method for apoptosis phenomenon characterization based on apoptotic cell quantification and detection using active contours. Subsequently, we employ appropriate data mining techniques and perform characterization of apoptosis on digital microscopic images. A particular class of clustering algorithms, utilizing information driven by the Principal Component Analysis, has been very successful in dealing with such data. In this work, we employ a recently proposed clustering algorithm to solve this real world clustering task.
  • Keywords
    biological techniques; biology computing; cellular biophysics; computer vision; data mining; optical microscopy; pattern clustering; principal component analysis; active contours; advanced clustering techniques; apoptosis classification; apoptosis phenomenon characterization; apoptotic cell detection; apoptotic cell quantification; clustering algorithms; data mining techniques; digital microscopic images; principal component analysis; programmed cell death; Accuracy; Algorithm design and analysis; Classification algorithms; Clustering algorithms; Data mining; Microscopy; Partitioning algorithms; Algorithms; Apoptosis; Cluster Analysis; Humans; Imaging, Three-Dimensional; Microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
  • Conference_Location
    Buenos Aires
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4123-5
  • Type

    conf

  • DOI
    10.1109/IEMBS.2010.5626777
  • Filename
    5626777