DocumentCode :
2931983
Title :
Thru-match-short calibration for time domain network analysis
Author :
Hayden, L.A. ; Tripathi, V.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
fYear :
1992
fDate :
1-5 June 1992
Firstpage :
1447
Abstract :
A technique for obtaining corrected two-port network parameters from time-domain reflection/transmission (TDR/T) measurements is described. This method is based on the thru-match-short (TMS) calibration procedure and allows for the extension of general vector network analysis (VNA) techniques to the correction of time-domain measurements. The calibration is complete and accounts for both source and load mismatches and pass-thru errors as well as the shape of the excitation waveform. Frequency-domain results from example measurements in both SMA and wafer probe environments using the time domain network analysis technique presented are compared with VNA measurements for validation.<>
Keywords :
calibration; microwave measurement; network analysers; time-domain reflectometry; SMA; excitation waveform; load mismatches; pass-thru errors; reflection/transmission measurements; source mismatches; thru-match-short calibration; time domain network analysis; two-port network parameters; vector network analysis; wafer probe; Bandwidth; Calibration; Circuits; Frequency domain analysis; Probes; Sampling methods; Time domain analysis; Time measurement; Transmission line measurements; Transmission line theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-0611-2
Type :
conf
DOI :
10.1109/MWSYM.1992.188282
Filename :
188282
Link To Document :
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