• DocumentCode
    2932028
  • Title

    Introducing the through-line deembedding procedure

  • Author

    Steer, M.B. ; Goldberg, S.B. ; Rinne, G. ; Franzon, P.D. ; Turlik, I. ; Kasten, J.S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
  • fYear
    1992
  • fDate
    1-5 June 1992
  • Firstpage
    1455
  • Abstract
    The through-line (TL) method is introduced to replace the through-reflect-line (TRL) deembedding procedure. TL utilizes measurements of two lengths of line following approximate open-short-line calibration. TL accounts for the frequency-dependent characteristic impedance of the line and avoids the periodic glitches inherent in the TRL procedure.<>
  • Keywords
    calibration; microwave measurement; time-domain reflectometry; frequency-dependent characteristic impedance; microwave measurement; open-short-line calibration; through-line deembedding procedure; time domain; Calibration; Capacitance measurement; Digital systems; Fixtures; Frequency; Impedance measurement; Laboratories; Reflection; Testing; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1992., IEEE MTT-S International
  • Conference_Location
    Albuquerque, NM, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-0611-2
  • Type

    conf

  • DOI
    10.1109/MWSYM.1992.188284
  • Filename
    188284
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2932028