Title :
Combining yield optimization with circuit level electromagnetic simulation (MMIC design)
Author :
Meehan, M.D. ; Draxler, P. ; Henning, L.C.
Author_Institution :
EEsof Inc., Westlake Village, CA, USA
Abstract :
A method for first-pass MMIC (monolithic microwave integrated circuit) design success is presented. The power of statistical design and modeling is combined with that of circuit-level electromagnetic simulation in a CAD (computer-aided-design) system, providing the ultimate means for predicting production success. The performance of the proposed CAD system is verified by comparing simulated and actual statistical response characteristics of a three-stage, 7-11-GHz low-noise-amplifier GaAs MMIC.<>
Keywords :
MMIC; circuit CAD; circuit analysis computing; statistical analysis; 7 to 11 GHz; CAD system; GaAs; LNA; MMIC; SHF; circuit level electromagnetic simulation; computer-aided-design; first-pass design; low-noise-amplifier; monolithic microwave integrated circuit; statistical design; yield optimization; Circuit simulation; Computational modeling; Design automation; Integrated circuit yield; MMICs; Microwave integrated circuits; Microwave theory and techniques; Monolithic integrated circuits; Power system modeling; Predictive models;
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-0611-2
DOI :
10.1109/MWSYM.1992.188288
