Combining yield optimization with circuit level electromagnetic simulation (MMIC design)

Author

Meehan, M.D. ; Draxler, P. ; Henning, L.C.

Author_Institution

EEsof Inc., Westlake Village, CA, USA

fYear

1992

fDate

1-5 June 1992

Firstpage

1469

Abstract

A method for first-pass MMIC (monolithic microwave integrated circuit) design success is presented. The power of statistical design and modeling is combined with that of circuit-level electromagnetic simulation in a CAD (computer-aided-design) system, providing the ultimate means for predicting production success. The performance of the proposed CAD system is verified by comparing simulated and actual statistical response characteristics of a three-stage, 7-11-GHz low-noise-amplifier GaAs MMIC.<>

Keywords

MMIC; circuit CAD; circuit analysis computing; statistical analysis; 7 to 11 GHz; CAD system; GaAs; LNA; MMIC; SHF; circuit level electromagnetic simulation; computer-aided-design; first-pass design; low-noise-amplifier; monolithic microwave integrated circuit; statistical design; yield optimization; Circuit simulation; Computational modeling; Design automation; Integrated circuit yield; MMICs; Microwave integrated circuits; Microwave theory and techniques; Monolithic integrated circuits; Power system modeling; Predictive models;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1992., IEEE MTT-S International

Conference_Location

Albuquerque, NM, USA

ISSN

0149-645X

Print_ISBN

0-7803-0611-2

Type

conf

DOI

10.1109/MWSYM.1992.188288

Filename

188288