Title :
Probabilistic characterization of uncertainty in the photovoltaic cell modeling
Author :
Chiodo, E. ; Lauria, D. ; Pagano, M.
Author_Institution :
Dept. of Electr. Eng., Univ. of Naples, Naples, Italy
Abstract :
In the paper the uncertainty of the photovoltaic (PV) cell model, by properly deriving the probability density function of the interest parameters, is characterized. This issue is crucial for predicting the capability of the photovoltaic source in producing electrical energy, but also for the control aspects of designing an efficient Maximum Power Point Tracker (MPPT). The PV source is modeled by means of a five parameters model: Iph, I0, VT, Rs and Rsh. The probabilistic approach is based upon the knowledge of the cell datasheet. The shunt resistance Rsh, in absence of information, is characterized by a Gamma distribution. A statistical analysis, based upon Monte Carlo simulation, is performed for verify how the other parameters can be affected by the stochastic nature of the random variable. In the final part of the paper, the uncertainty of the datasheet values is also introduced. A case study is reported and the numerical results are discussed in detail.
Keywords :
Monte Carlo methods; gamma distribution; maximum power point trackers; photovoltaic power systems; power system simulation; random processes; statistical analysis; stochastic processes; Gamma distribution; MPPT; Monte Carlo simulation; PV cell modeling uncertainty; cell datasheet uncertainty; electrical energy production; maximum power point tracker; photovoltaic cell modeling uncertainty; photovoltaic source; probabilistic characterization; probability density function; random variable; shunt resistance; statistical analysis; stochastic nature; Histograms; Integrated circuit modeling; Probabilistic logic; Probability density function; Random variables; Resistance; Uncertainty; Analytical model; design and control; photovoltaic source; probabilistic approach;
Conference_Titel :
Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM), 2012 International Symposium on
Conference_Location :
Sorrento
Print_ISBN :
978-1-4673-1299-8
DOI :
10.1109/SPEEDAM.2012.6264604