• DocumentCode
    2932253
  • Title

    Alternative method of A/D conversion quality verification

  • Author

    Pokorný, Martin ; Haasz, Vladimir

  • Author_Institution
    Fac. of Electr. Eng., Czech Tech. Univ., Prague, Czech Republic
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1421
  • Abstract
    Well known methods for testing ADC dynamic quality (FFT Test, best sinusoidal curve fit method, histogram test) require a low-distortion generator and it can be a problem testing high-resolution and middle-resolution high-speed ADCs. The paper describes a new alternative method-spectrum correction test. It is based on the FFT test, but the distortion of a testing signal is corrected. The basic idea is the fact that the Fourier transform is a linear operation. Therefore it is possible to recognise spectral lines, which belong to the generator used and the lines of the ADC. The spectrum measured on the ADC´s output can be corrected for the known spectrum of the generator. A PC simulation was executed to investigate if this method could be used. Then the system for evaluation of the test was designed and realised. The first experience and achieved results are also published in this paper
  • Keywords
    analogue-digital conversion; electric distortion; high-speed integrated circuits; integrated circuit testing; spectral analysis; A/D conversion; dynamic quality; high-speed ADCs; quality verification; spectral lines; spectrum correction test; testing signal distortion; Frequency; Histograms; Length measurement; Passive filters; Power harmonic filters; Signal generators; Signal resolution; Signal to noise ratio; Testing; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
  • Conference_Location
    Venice
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5276-9
  • Type

    conf

  • DOI
    10.1109/IMTC.1999.776043
  • Filename
    776043