Title :
Device circuit interaction in the common source amplifier
Author :
Webster, D.R. ; Parker, A.E. ; Haigh, D.G. ; Radmore, P.M.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. Coll. London, UK
fDate :
30 May-2 Jun 1994
Abstract :
The non-linearity demonstrated by a circuit is a function of the device nonlinearity, its parasitic components and the circuit components in which it is embedded. We demonstrate that the common source stage, which is used extensively for Device Characterisation, presents a very complex form of Device-Circuit Interaction, which makes reliable extraction of its intrinsic non-linear parameters extremely difficult. We show how pulse measurements can provide a straight forward access to parameters needed for Volterra Analysis and show the true nature of output conductance
Keywords :
Volterra series; amplifiers; nonlinear network analysis; Volterra analysis; common source amplifier; device circuit interaction; nonlinearity; output conductance; parasitic components; pulse measurements; Frequency; Gallium arsenide; Impedance; Integrated circuit reliability; MMICs; Microwave devices; Microwave integrated circuits; Monolithic integrated circuits; Pulse measurements; Voltage;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.409349
