DocumentCode
2932662
Title
Development of underfill material with high valued performance
Author
Wada, Masahuo
Author_Institution
Electron. Device Mater. Res. Lab., Sumitomo Bakelite Co. Ltd., Yokohama, Japan
fYear
1999
fDate
1999
Firstpage
56
Lastpage
60
Abstract
Flip chip packages are one of the most important devices in the semiconductor area. Currently, in order to reduce process costs, shorter cycle time for assembly of flip chip package is required. For this purpose, we studied underfill materials with short cure properties. In this report, we confirmed that both good adhesion, even after humidity treatment, and no voiding after cure resulted in good reliability. In addition, we found that the catalyst structure with polar groups and a suitable distribution of filler were important for a shorter cure property
Keywords
adhesion; catalysts; flip-chip devices; integrated circuit packaging; integrated circuit reliability; adhesion; assembly; catalyst; cure process; cycle time; flip-chip package; humidity treatment; reliability; semiconductor device; underfill material; voiding; Circuit testing; Electronics packaging; Filling; Flip chip; Materials reliability; Materials testing; Printed circuits; Semiconductor materials; Thermal expansion; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
0-7803-5231-9
Type
conf
DOI
10.1109/ECTC.1999.776064
Filename
776064
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