Title :
Development of underfill material with high valued performance
Author_Institution :
Electron. Device Mater. Res. Lab., Sumitomo Bakelite Co. Ltd., Yokohama, Japan
Abstract :
Flip chip packages are one of the most important devices in the semiconductor area. Currently, in order to reduce process costs, shorter cycle time for assembly of flip chip package is required. For this purpose, we studied underfill materials with short cure properties. In this report, we confirmed that both good adhesion, even after humidity treatment, and no voiding after cure resulted in good reliability. In addition, we found that the catalyst structure with polar groups and a suitable distribution of filler were important for a shorter cure property
Keywords :
adhesion; catalysts; flip-chip devices; integrated circuit packaging; integrated circuit reliability; adhesion; assembly; catalyst; cure process; cycle time; flip-chip package; humidity treatment; reliability; semiconductor device; underfill material; voiding; Circuit testing; Electronics packaging; Filling; Flip chip; Materials reliability; Materials testing; Printed circuits; Semiconductor materials; Thermal expansion; Thermal stresses;
Conference_Titel :
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-5231-9
DOI :
10.1109/ECTC.1999.776064