• DocumentCode
    2932662
  • Title

    Development of underfill material with high valued performance

  • Author

    Wada, Masahuo

  • Author_Institution
    Electron. Device Mater. Res. Lab., Sumitomo Bakelite Co. Ltd., Yokohama, Japan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    56
  • Lastpage
    60
  • Abstract
    Flip chip packages are one of the most important devices in the semiconductor area. Currently, in order to reduce process costs, shorter cycle time for assembly of flip chip package is required. For this purpose, we studied underfill materials with short cure properties. In this report, we confirmed that both good adhesion, even after humidity treatment, and no voiding after cure resulted in good reliability. In addition, we found that the catalyst structure with polar groups and a suitable distribution of filler were important for a shorter cure property
  • Keywords
    adhesion; catalysts; flip-chip devices; integrated circuit packaging; integrated circuit reliability; adhesion; assembly; catalyst; cure process; cycle time; flip-chip package; humidity treatment; reliability; semiconductor device; underfill material; voiding; Circuit testing; Electronics packaging; Filling; Flip chip; Materials reliability; Materials testing; Printed circuits; Semiconductor materials; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-5231-9
  • Type

    conf

  • DOI
    10.1109/ECTC.1999.776064
  • Filename
    776064