DocumentCode
2932701
Title
Area, reconfiguration delay and reliability trade-offs in designing reliable multi-mode FIR filters
Author
Gholamipour, Amir Hossein ; Papadimitriou, Kyprianos ; Kurdahi, Fadi ; Dollas, Apostolos ; Eltawil, Ahmed
Author_Institution
Univ. of California, Irvine, CA, USA
fYear
2011
fDate
11-14 Dec. 2011
Firstpage
82
Lastpage
87
Abstract
Wide range of digital systems from wireless devices to multi-media terminals are characterized by their multi-mode behavior. Many of these systems are deployed in high-radiation environments [5]. SRAM-based FPGAs are popular platforms to implement multi-mode systems, because of their high performance and reconfigurability. However, high susceptibility of FPGAs toward Soft Errors makes them less-than-reliable platforms. To overcome the reliability issue, various redundancy techniques have been proposed. These techniques exhibit different design and reliability characteristics. Considering the combined effect of design decisions and reliability techniques on system characteristics a coherent strategy should be devised to meet system requirements and constraints. In this work we propose a method to explore the design space for implementing a reliable multi-mode system. As we will show, different selections of design parameters and redundancy techniques generate a range of solutions which trade-off total area, reconfiguration overhead and reliability of the system. The choice of a specific solution remains a decision made by the system-designer.
Keywords
FIR filters; SRAM chips; delay filters; field programmable gate arrays; integrated circuit reliability; radiation hardening (electronics); redundancy; SRAM-based FPGA; digital systems; multimedia terminals; multimode FIR filters; reconfiguration delay; reconfiguration overhead; redundancy; reliability; soft errors; trade-off total area; wireless devices; Circuit faults; Field programmable gate arrays; Finite impulse response filter; Redundancy; Reliability engineering; Tunneling magnetoresistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Test Workshop (IDT), 2011 IEEE 6th International
Conference_Location
Beirut
ISSN
2162-0601
Print_ISBN
978-1-4673-0468-9
Electronic_ISBN
2162-0601
Type
conf
DOI
10.1109/IDT.2011.6123107
Filename
6123107
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