• DocumentCode
    2932701
  • Title

    Area, reconfiguration delay and reliability trade-offs in designing reliable multi-mode FIR filters

  • Author

    Gholamipour, Amir Hossein ; Papadimitriou, Kyprianos ; Kurdahi, Fadi ; Dollas, Apostolos ; Eltawil, Ahmed

  • Author_Institution
    Univ. of California, Irvine, CA, USA
  • fYear
    2011
  • fDate
    11-14 Dec. 2011
  • Firstpage
    82
  • Lastpage
    87
  • Abstract
    Wide range of digital systems from wireless devices to multi-media terminals are characterized by their multi-mode behavior. Many of these systems are deployed in high-radiation environments [5]. SRAM-based FPGAs are popular platforms to implement multi-mode systems, because of their high performance and reconfigurability. However, high susceptibility of FPGAs toward Soft Errors makes them less-than-reliable platforms. To overcome the reliability issue, various redundancy techniques have been proposed. These techniques exhibit different design and reliability characteristics. Considering the combined effect of design decisions and reliability techniques on system characteristics a coherent strategy should be devised to meet system requirements and constraints. In this work we propose a method to explore the design space for implementing a reliable multi-mode system. As we will show, different selections of design parameters and redundancy techniques generate a range of solutions which trade-off total area, reconfiguration overhead and reliability of the system. The choice of a specific solution remains a decision made by the system-designer.
  • Keywords
    FIR filters; SRAM chips; delay filters; field programmable gate arrays; integrated circuit reliability; radiation hardening (electronics); redundancy; SRAM-based FPGA; digital systems; multimedia terminals; multimode FIR filters; reconfiguration delay; reconfiguration overhead; redundancy; reliability; soft errors; trade-off total area; wireless devices; Circuit faults; Field programmable gate arrays; Finite impulse response filter; Redundancy; Reliability engineering; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop (IDT), 2011 IEEE 6th International
  • Conference_Location
    Beirut
  • ISSN
    2162-0601
  • Print_ISBN
    978-1-4673-0468-9
  • Electronic_ISBN
    2162-0601
  • Type

    conf

  • DOI
    10.1109/IDT.2011.6123107
  • Filename
    6123107