DocumentCode :
2932753
Title :
Deterministic multisubband device simulations for strained double gate PMOSFETs including magnetotransport
Author :
Pham, A.T. ; Jungemann, C. ; Meinerzhagen, B.
Author_Institution :
Tech. Univ. Braunschweig, Braunschweig
fYear :
2008
fDate :
15-17 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
The authors present, for the first time, deterministic 2D multisubband device simulations based on the self consistent solution of SE-PE-BTE for PMOSFETs including the Pauli principle, magnetic fields, and without any simplification of the subband structure. The deterministic method yields truly stationary solutions and can resolve small changes in the solution due to magnetic fields or small changes in the bias conditions. The magnetoresistance mobility extraction method is investigated and compared to the conventional mobility extraction technique for short channel devices.
Keywords :
MOSFET; magnetic fields; magnetoresistance; SE-PE-BTE; deterministic multisubband device simulations; magnetic fields; magnetoresistance mobility extraction; magnetotransport; short channel devices; strained double gate PMOSFET; Anisotropic magnetoresistance; Lattices; MOSFETs; Magnetic devices; Magnetic fields; Nonlinear equations; Poisson equations; Scattering; Stress; Uniaxial strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2008. IEDM 2008. IEEE International
Conference_Location :
San Francisco, CA
ISSN :
8164-2284
Print_ISBN :
978-1-4244-2377-4
Electronic_ISBN :
8164-2284
Type :
conf
DOI :
10.1109/IEDM.2008.4796844
Filename :
4796844
Link To Document :
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