DocumentCode
2932753
Title
Deterministic multisubband device simulations for strained double gate PMOSFETs including magnetotransport
Author
Pham, A.T. ; Jungemann, C. ; Meinerzhagen, B.
Author_Institution
Tech. Univ. Braunschweig, Braunschweig
fYear
2008
fDate
15-17 Dec. 2008
Firstpage
1
Lastpage
4
Abstract
The authors present, for the first time, deterministic 2D multisubband device simulations based on the self consistent solution of SE-PE-BTE for PMOSFETs including the Pauli principle, magnetic fields, and without any simplification of the subband structure. The deterministic method yields truly stationary solutions and can resolve small changes in the solution due to magnetic fields or small changes in the bias conditions. The magnetoresistance mobility extraction method is investigated and compared to the conventional mobility extraction technique for short channel devices.
Keywords
MOSFET; magnetic fields; magnetoresistance; SE-PE-BTE; deterministic multisubband device simulations; magnetic fields; magnetoresistance mobility extraction; magnetotransport; short channel devices; strained double gate PMOSFET; Anisotropic magnetoresistance; Lattices; MOSFETs; Magnetic devices; Magnetic fields; Nonlinear equations; Poisson equations; Scattering; Stress; Uniaxial strain;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2008. IEDM 2008. IEEE International
Conference_Location
San Francisco, CA
ISSN
8164-2284
Print_ISBN
978-1-4244-2377-4
Electronic_ISBN
8164-2284
Type
conf
DOI
10.1109/IEDM.2008.4796844
Filename
4796844
Link To Document