DocumentCode
2932798
Title
On strain and scattering in deeply-scaled n-channel MOSFETs: A quantum-corrected semiclassical Monte Carlo analysis
Author
Shi, Ningyu ; Register, Leonard F. ; Banerjee, Sanjay K.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX
fYear
2008
fDate
15-17 Dec. 2008
Firstpage
1
Lastpage
4
Abstract
A model of valley-dependent quantum-confinement-enhanced scattering for electrons has added to the existing quantum corrections in our full band Monte Carlo simulator, Monte Carlo of the University of Texas (MCUT). The simulator was then calibrated to fit channel mobility curves, both strained and unstrained, by adjusting surface roughness parameters. After testing different strain & surface orientation combinations, we find that, in order, uniaxial tensile [110] and biaxial tensile (001) strain with [110] channel orientations in each case represent the optimal scenarios for electron transport. A decreasing advantage of strain with down-scaling is exhibited. Significantly, we find unexpected benefits and limitations of strain, as well as limitations on the use of mobility or even thermal velocity for predicting these effects.
Keywords
MOSFET; Monte Carlo methods; electron transport theory; surface roughness; channel mobility curves; deeply-scaled n-channel MOSFET; electron transport; quantum-corrected semiclassical Monte Carlo analysis; surface roughness parameters; valley-dependent quantum-confinement- enhanced scattering; Capacitive sensors; Electrons; MOSFETs; Monte Carlo methods; Particle scattering; Rough surfaces; Surface fitting; Surface roughness; Tensile strain; Uniaxial strain;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2008. IEDM 2008. IEEE International
Conference_Location
San Francisco, CA
ISSN
8164-2284
Print_ISBN
978-1-4244-2377-4
Electronic_ISBN
8164-2284
Type
conf
DOI
10.1109/IEDM.2008.4796846
Filename
4796846
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