• DocumentCode
    2932798
  • Title

    On strain and scattering in deeply-scaled n-channel MOSFETs: A quantum-corrected semiclassical Monte Carlo analysis

  • Author

    Shi, Ningyu ; Register, Leonard F. ; Banerjee, Sanjay K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX
  • fYear
    2008
  • fDate
    15-17 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A model of valley-dependent quantum-confinement-enhanced scattering for electrons has added to the existing quantum corrections in our full band Monte Carlo simulator, Monte Carlo of the University of Texas (MCUT). The simulator was then calibrated to fit channel mobility curves, both strained and unstrained, by adjusting surface roughness parameters. After testing different strain & surface orientation combinations, we find that, in order, uniaxial tensile [110] and biaxial tensile (001) strain with [110] channel orientations in each case represent the optimal scenarios for electron transport. A decreasing advantage of strain with down-scaling is exhibited. Significantly, we find unexpected benefits and limitations of strain, as well as limitations on the use of mobility or even thermal velocity for predicting these effects.
  • Keywords
    MOSFET; Monte Carlo methods; electron transport theory; surface roughness; channel mobility curves; deeply-scaled n-channel MOSFET; electron transport; quantum-corrected semiclassical Monte Carlo analysis; surface roughness parameters; valley-dependent quantum-confinement- enhanced scattering; Capacitive sensors; Electrons; MOSFETs; Monte Carlo methods; Particle scattering; Rough surfaces; Surface fitting; Surface roughness; Tensile strain; Uniaxial strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2008. IEDM 2008. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    8164-2284
  • Print_ISBN
    978-1-4244-2377-4
  • Electronic_ISBN
    8164-2284
  • Type

    conf

  • DOI
    10.1109/IEDM.2008.4796846
  • Filename
    4796846