Overview of IEEE-STD-1241 “standard for terminology and test methods for analog-to-digital converters”

Author

Tilden, Steven J. ; Linnenbrink, Thomas E. ; Green, Philip J.

Author_Institution

Burr-Brown Corp., Tucson, AZ, USA

Volume

3

fYear

1999

fDate

1999

Firstpage

1498

Abstract

IEEE-STD-1241 has been drafted and is being revised this year to prepare for ballot and publishing. A year ago, the IEEE office asked us to also coordinate its release with the IEC to make it a full International standard. We have been diligently working this requirement to ensure acceptance and use by engineers throughout the world. This paper introduces this soon-to-be-published standard. ADCs may exhibit many unique characteristics due to the numerous features and wide range of application uses. It became apparent many years ago that there were inconsistencies between the way ADCs were specified and tested, which created the need for standardization. To help solve these issues, the IEEE formed a working group of dedicated experts to draft and edit a standard that could be used for many years and meet the needs of all users

Keywords

IEEE standards; analogue-digital conversion; circuit testing; integrated circuit testing; nomenclature; A/D convertors; ADC; IEEE-STD-1241; International standard; analog-to-digital converters; standardization; Analog-digital conversion; Apertures; Clocks; Error correction; IEC standards; Manufacturing; Measurement standards; Standards publication; System testing; Terminology;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE

Conference_Location

Venice

ISSN

1091-5281

Print_ISBN

0-7803-5276-9

Type

conf

DOI

10.1109/IMTC.1999.776076

Filename

776076