• DocumentCode
    2932882
  • Title

    IDT 2011 Table of contents

  • fYear
    2011
  • fDate
    11-14 Dec. 2011
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The following topics are dealt with: NOC design; SOC design; analog design; analog test; layout impact; integrated circuit nanometer design; and voltage modeling.
  • Keywords
    analogue integrated circuits; integrated circuit layout; integrated circuit modelling; network-on-chip; NOC design; SOC design; analog design; analog test; integrated circuit nanometer design; layout impact; voltage modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop (IDT), 2011 IEEE 6th International
  • Conference_Location
    Beirut
  • ISSN
    2162-0601
  • Print_ISBN
    978-1-4673-0468-9
  • Electronic_ISBN
    2162-0601
  • Type

    conf

  • DOI
    10.1109/IDT.2011.6123118
  • Filename
    6123118
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2932882