Title :
Sine-fitting software for IEEE Standards 1057 and 1241
Author_Institution :
Bechtel Corp., NV, USA
Abstract :
The author demonstrates software that performs the calculations related to the sine-fit tests of IEEE Standard 1057-94 for digital waveform recorders and IEEE Standard 1241 for analog to digital converters, which is currently in preparation. He shows example outputs and explains how to use these outputs determine the important characteristics of the device under test (DUT)
Keywords :
IEEE standards; analogue-digital conversion; curve fitting; electronic engineering computing; engineering graphics; recorders; virtual instrumentation; A/D convertors; ADC; IEEE standards 1057; IEEE standards 1241; LabView; analog to digital converters; digital waveform recorders; sine-fit tests; sine-fitting software; sinewave tests; Analog-digital conversion; Contracts; Frequency estimation; Harmonic distortion; Instruments; Laboratories; Performance evaluation; Software performance; Software standards; Software testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776077
