Title :
101 ways to make a circuit fail
Author :
Toumazou, Chris ; Bryant, James ; Allen, Philip E. ; Bowers, Derek F. ; Gilbert, Banie ; Brombacher, Aamout
Author_Institution :
Dept. of Electr. & Electron. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK
fDate :
30 May-2 Jun 1994
Abstract :
A circuit design, whether on first silicon, breadboarded or PCB´s will quite often fail to work first time and getting it to work is costly time-consuming, irritating and sometimes very frustrating. If the failure is inevitable, then why are more precautions not taken at the earlier stages of design? What are these mystical failure mechanisms? Human errors, simulation errors, testing errors? etc. The authors attempt to answer some of these questions
Keywords :
circuit reliability; circuit testing; errors; failure analysis; circuit failure; electrical circuits; failure mechanisms; Analog circuits; Circuit simulation; Circuit synthesis; Circuit testing; Content addressable storage; Educational institutions; Failure analysis; Humans; Signal Processing Society; Silicon;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.409452