DocumentCode
2933012
Title
Using spectral warping for instrumentation and measurements in mixed-signal testing
Author
Demidenkol, S. ; Piuri, V.
Author_Institution
Inst. of Inf. Sci. & Technol., Massey Univ., Palmerston North, New Zealand
Volume
3
fYear
1999
fDate
1999
Firstpage
1547
Abstract
Spectral warping (SW) is the digital signal processing (DSP) procedure of transforming an original digital sequence to a new one having special spectral properties: equally spaced samples of its DFT (Discrete Fourier Transform) are identical to the unequally-spaced frequency samples of DFT of the original sequence. The use of SW can open up new opportunities in test signal generation as well as in test response analysis for mixed signal circuits
Keywords
automatic test pattern generation; built-in self test; digital filters; discrete Fourier transforms; integrated circuit testing; mixed analogue-digital integrated circuits; signal representation; spectral analysis; BIST; DSP procedure; all-pass digital filter cascade; discrete Fourier transform; discrete-time signal; equally spaced samples; fault models; mixed-signal testing; signal representation; spectral warping; test response analysis; test signal generation; unequally-spaced frequency samples; Built-in self-test; Circuit testing; Cybernetics; Digital signal processing; Discrete Fourier transforms; Frequency measurement; Instruments; Sampling methods; Sequences; Signal generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location
Venice
ISSN
1091-5281
Print_ISBN
0-7803-5276-9
Type
conf
DOI
10.1109/IMTC.1999.776085
Filename
776085
Link To Document