• DocumentCode
    2933012
  • Title

    Using spectral warping for instrumentation and measurements in mixed-signal testing

  • Author

    Demidenkol, S. ; Piuri, V.

  • Author_Institution
    Inst. of Inf. Sci. & Technol., Massey Univ., Palmerston North, New Zealand
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1547
  • Abstract
    Spectral warping (SW) is the digital signal processing (DSP) procedure of transforming an original digital sequence to a new one having special spectral properties: equally spaced samples of its DFT (Discrete Fourier Transform) are identical to the unequally-spaced frequency samples of DFT of the original sequence. The use of SW can open up new opportunities in test signal generation as well as in test response analysis for mixed signal circuits
  • Keywords
    automatic test pattern generation; built-in self test; digital filters; discrete Fourier transforms; integrated circuit testing; mixed analogue-digital integrated circuits; signal representation; spectral analysis; BIST; DSP procedure; all-pass digital filter cascade; discrete Fourier transform; discrete-time signal; equally spaced samples; fault models; mixed-signal testing; signal representation; spectral warping; test response analysis; test signal generation; unequally-spaced frequency samples; Built-in self-test; Circuit testing; Cybernetics; Digital signal processing; Discrete Fourier transforms; Frequency measurement; Instruments; Sampling methods; Sequences; Signal generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
  • Conference_Location
    Venice
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5276-9
  • Type

    conf

  • DOI
    10.1109/IMTC.1999.776085
  • Filename
    776085