Investigations of mixed-signal circuits equipped with innovative test bus

Author

Borkowska, Maria ; Gonera, Marek

Author_Institution

Ind. Inst. of Electron., Warsaw, Poland

Volume

3

fYear

1999

fDate

1999

Firstpage

1553

Abstract

The subject of the investigation was the efficiency of diagnostics by means of the IEEE Std. P1149.4 mixed-signal test bus. The novelty is the possibility to test analog part of circuits which is achieved thanks to the analog lines and the analog modules of the bus. Correctness of probes created by digital and analog boundary modules of the bus was checked. Interconnections, the presence and value of discrete components and integrated circuits were investigated in the models equipped with the test bus. The results of works aimed at evaluation of the properties of IEEE Std. P1149.4 test bus are presented

Keywords

IEEE standards; automatic testing; boundary scan testing; design for testability; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; IEEE Std. P1149.4 mixed-signal test bus; analog lines; analog modules; analog test bus interface; boundary scan test bus; circuit partitioning; design for testability; diagnostics efficiency; discrete components; fault diagnostics; integrated circuits; interconnections; mixed-signal circuits; Circuit testing; Electronic equipment testing; Electronics industry; Industrial electronics; Integrated circuit modeling; Integrated circuit testing; Logic circuits; Pins; Probes; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE

Conference_Location

Venice

ISSN

1091-5281

Print_ISBN

0-7803-5276-9

Type

conf

DOI

10.1109/IMTC.1999.776086

Filename

776086