Title :
Exploring DCT coefficient quantization effect for image tampering localization
Author :
Wang, Wei ; Dong, Jing ; Tan, Tieniu
Author_Institution :
Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
fDate :
Nov. 29 2011-Dec. 2 2011
Abstract :
In this paper, we focus on image tampering detection and tampered region localization. We find that the probability distributions of the DCT coefficients of a JEPG image will be influenced by tampering operation. Hence, we model the distributions of AC DCT coefficients of JPEG image and detect the tampered region from the unchanged region by using their different distributions. Based on an assumption of Laplacian distribution of unquantized AC DCT coefficients, Laplacian Mixture Model (LMM) is employed to model the quantized AC DCT coefficient distribution of a suspicious JPEG image. With the help of Expectation Maximization (EM) algorithm, the probability of an 8 × 8 block being tampered can be estimated; and then, a sophisticated image segmentation method, graph cut, is applied to determine the tampered region. Extensive experimental results on large scale databases prove the effectiveness of our proposed method which is suitable for different tampered region sizes at all levels including pixel, region and image level.
Keywords :
discrete cosine transforms; expectation-maximisation algorithm; image segmentation; quantisation (signal); statistical distributions; DCT coefficient quantization effect; EM algorithm; LMM; Laplacian distribution; Laplacian mixture model; expectation maximization; graph cut; image tampering detection; image tampering localization; large scale databases; probability distributions; quantized AC DCT coefficient distribution; sophisticated image segmentation; suspicious JPEG image; tampered region localization; unquantized AC DCT coefficients; Accuracy; Discrete cosine transforms; Image coding; Image segmentation; Laplace equations; Quantization; Transform coding;
Conference_Titel :
Information Forensics and Security (WIFS), 2011 IEEE International Workshop on
Conference_Location :
Iguacu Falls
Print_ISBN :
978-1-4577-1017-9
Electronic_ISBN :
978-1-4577-1018-6
DOI :
10.1109/WIFS.2011.6123129