DocumentCode
2933141
Title
Systematic composition and analyzability of dependable networked embedded computing systems
Author
Kim, K.H.
Author_Institution
DREAM Lab, California Univ., Irvine, CA
fYear
2006
fDate
2-4 Oct. 2006
Abstract
In the past decade, the application field of networked embedded computing systems (NECSs) has been showing gradual acceleration in its growth. A great majority of NECSs are subject to some fault tolerance requirements. In other words, in their application environments, the fault rates of some components, e.g., communication links, batteries, some chips, etc., are not negligible. So, research interests in fault-tolerant (FT) NECSs have been showing growing trends in the past decade in good contrast to the relatively stagnant research interests in more traditional branches of FTC such as FT data servers, etc. In particular, object-/component-oriented (OO/CO) structuring techniques for RT distributed computing systems have been established in highly promising forms with convincing demonstrations although they are still very slow in spreading through industry. Such OO/CO structuring techniques not only lead to efficient design of RTC application systems with considerably reduced labor and improved maintainability but also enable design of complex systems yielding analyzable and yet tight response time bounds. On the basis of such foundation for designing RTC systems, research in FT NECS can now proceed with much improved effectiveness and confidence
Keywords
embedded systems; object-oriented programming; software fault tolerance; RT distributed computing systems; component-oriented structuring technique; dependable networked embedded computing systems; fault tolerance requirements; object-oriented structuring technique; Delay; Distributed computing; Embedded computing; Fault detection; Fault tolerance; Fault tolerant systems; Middleware; National electric code; Network servers; Refining;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliable Distributed Systems, 2006. SRDS '06. 25th IEEE Symposium on
Conference_Location
Leeds
ISSN
1060-9857
Print_ISBN
0-7695-2677-2
Type
conf
DOI
10.1109/SRDS.2006.45
Filename
4032495
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