• DocumentCode
    2933149
  • Title

    A finite element based technique for microwave imaging of two-dimensional objects

  • Author

    Rekanos, Ioannis T. ; Tsiboukis, Theodoros D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki, Greece
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1576
  • Abstract
    In this paper, a microwave imaging technique for estimating the spatial distributions of the permittivity and the conductivity of a scatterer, by post-processing electromagnetic scattered field data, is presented. The proposed technique is based on the minimization of an error function via the Polak-Ribiere algorithm. For the description of the direct scattering problem, the differential formulation is applied. This allows the use of the finite element method. During the inversion, the computation of the derivative of the finite element solution with respect to the parameters, which describe the scatterer, is required. This task is performed by a finite element based sensitivity analysis scheme, which is enhanced by applying the adjoint state vector methodology. The merits of the proposed technique are examined by applying it to both transverse magnetic and transverse electric polarization cases. Finally, the technique is adopted by a frequency-hopping approach to cope with multifrequency inverse scattering problems
  • Keywords
    electromagnetic wave scattering; finite element analysis; inverse problems; microwave imaging; Polak-Ribiere algorithm; adjoint state vector; conductivity; direct scattering; electromagnetic wave scattering; error function minimization; finite element method; frequency hopping; microwave imaging; multifrequency inverse scattering; permittivity; sensitivity analysis; spatial distribution; two-dimensional object; Conductivity; Electromagnetic fields; Electromagnetic scattering; Finite element methods; Microwave imaging; Microwave theory and techniques; Minimization methods; Permittivity; Scattering parameters; Sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
  • Conference_Location
    Venice
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5276-9
  • Type

    conf

  • DOI
    10.1109/IMTC.1999.776090
  • Filename
    776090